Xiaopeng Xi

Xiaopeng Xi

Post-doctoral researcher

Publications

Selected Journal Papers
  • L. Sheng, C. Li, M. Gao, X. Xi, D. Zhou. A review of SCADA-based condition monitoring for wind turbines via artificial neural networks. Neurocomputing, 2025, 633: 129830.
  • Y. Shao, X. He, B. Zhang, C. Cheng, X. Xi. ES-DLSSVM-based prognostics of rolling element bearings. IEEE Transactions on Reliability, 2024, 73(1): 317-327.
  • H. Zhang, X. Xi, R. Pan. A two-stage data-driven approach to remaining useful life prediction via long short-term memory networks. Reliability Engineering & System Safety, 2023, 237: 109332.
  • S. Chen, R. Yang, M. Zhong, X. Xi, C. Liu. A random forest and model-based hybrid method of fault diagnosis for satellite attitude control systems. IEEE Transactions on Instrumentation and Measurement, 2023, 72: 3518413.
  • X. Xi, D. Zhou. Prognostics of fractional degradation processes with state-dependent delay. Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability, 2022, 236(1): 114-124.
  • X. Xi, D. Zhou, M. Chen, N. Balakrishnan. Remaining useful life prediction for fractional degradation processes under varying modes. The Canadian Journal of Chemical Engineering, 2020, 98(6): 1351-1364.
  • X. Xi, D. Zhou, M. Chen, N. Balakrishnan, H. Zhang. Remaining useful life prediction for multivariable stochastic degradation systems with non-Markovian diffusion processes. Quality and Reliability Engineering International, 2020, 36(4): 1402-1421.
  • X. Xi, M. Chen, D. Zhou. Remaining useful life prediction for multi-component systems with hidden dependencies. Science China Information Sciences, 2019, 62(2): 022202.
  • H. Zhang, D. Zhou, M. Chen, X. Xi. Predicting remaining useful life based on a generalized degradation with fractional Brownian motion. Mechanical Systems and Signal Processing, 2019, 115: 736-752.
  • X. Xi, M. Chen, H. Zhang, D. Zhou. An improved non-Markovian degradation model with long-term dependency and item-to-item uncertainty. Mechanical Systems and Signal Processing, 2018, 105: 467-480.
  • X. Xi, M. Chen, D. Zhou. Remaining useful life prediction for degradation processes with memory effects. IEEE Transactions on Reliability, 2017, 66(3): 751-760.
  • H. Zhang, M. Chen, X. Xi, D. Zhou. Remaining useful life prediction for degradation processes with long-range dependence. IEEE Transactions on Reliability, 2017, 66(4): 1368-1379.